Invited Speakers



  • Nathalie Bozzolo, Centre de Mise en Forme de Matériaux  CEMEF – MINES ParisTech, CNRS,
    Lecture title: “Orientation mapping – an unavoidable tool for studying recrystallization phenomena
  • Philippe A. Buffat, Ecole Polytechnique Fédérale de Lausanne,
    Lecture title: “
Present capabilities and limits of EDS for materials science
  • Ali Gholinia, University of Manchester,
    Lecture title: “Automated three dimensional broad ion beam milling acquisition and analysis
  • Eva Olsson, Chalmers University,
    re title: “Linking atomic structure to properties- In Situ Electron Microscopy Studies of Functional Materials
  • Juan Carlos Hernández Garrido, Universidad de Cadiz,
    Lecture title “3D nano-metrology of catalytic-based materials by electron tomography: qualitative information and beyond”
  • Urszula Stachewicz, AGH University of Science and Technology,
    Lecture title: “3D imaging of polymer nanofibers using FIB-SEM tomography
  • Quentin Ramasse, SuperSTEM – The National Facility for Aberration Corrected STEM, Daresbury, UK
    Lecture title: “High-precision multimodal imaging workflows in the STEM: towards nano-metrology with atomic-level precision
  • Sebastian Glatt, Max Planck Research Group, Jagiellonian University
    Lecture title: “The Architecture of the Elongator complex determined by Integrative Structural Biology”
  • Kenji Matsuda, University of Toyama,
    Lecture title: “Fine precipitates formed at the early stage of aging in Al alloys containing Cu

  • Alicja Bachmatiuk, Wrocławskie Centrum Badań EIT+,
    Lecture title: “In-situ HR-TEM observations of 2D materials
  • Makoto Shiojiri, Kyoto Institute of Technology,
    Lecture title: High crystallinity nitride layers grown by newly developed atomic layer deposition and annealing techniques”
  • János Lábár, Institute for Technical Physics and Materials Science,
    Lecture title: “ePDF analysis in the TEM
  • Christoph T. Koch, Humboldt University of Berlin, Department of Physics, Berlin, Germany,
    Lecture title: “Practical aspects of simulation of high-resolution TEM images